TOF-MS

GC-TOF-MS

BenchTOF-dx™

The unique combination of high-performance & affordability to any GC/MS user interested in trace detection

BenchTOF-dx is a fast, high performance reflectron time-of-flight (TOF) mass spectrometer (MS) for analysing ultra-trace level volatile and semi-volatile organic chemicals in complex real-world samples. Novel architecture and proprietary noise reduction algorithms offer and unrivalled combination of:

Sensitivity, Compound resolution, Spectral quality and Robust operation

All clear advantages for trace analysis

......BenchTOF-dx Main Features

State-of-the-art ion optics & direct extraction technology maximise sensitivity. Full scan data at quadrupole SIM sensitivity levels (>800:1 s/n for 1 pg OFN while scanning over full mass range with DBC)
Enhanced detection of trace target analytes
High speed spectral acquisition (10,000 Hz) for compatibility with fast GC, GCxGC (2D GC) and complex conventional GC profiles. 100 "scansets" written to disc every second.
Mass range of 1 to 1000 amu, with mass resolution of 1000, ensures compatibility with every GC application
0.01 amu spectral display for 12C/13C isotope resolution
Long-term mass & detector-response stability reduces tuning/calibration frequency and optimises system productivity
Uniquely powerful noise reduction software minimises requirement for manual data manipulation
Integrates with existing third-party GC/MS data analysis software to minimise operator learning curve or uses own comprehensive data processing software package
Optimum versatility: Compatible with any make of GC and a wide range of hyphenated techniques
Low cost, compact technology that operates in standard laboratory environments ensuing fast return on investment

Enhanced sensitivity with direct extraction (dx)

In quadrupole MS instruments only a proportion of the ions produced in the ion sourse actually reach the detector because the technology utilises a mass filter which only allows on mass ion through the detector at a time. This reduces sensitivity.

In TOF MS all the ions entering the flight tube reach the detector without filtering. The result is greater sensitivity; the same sensitivity in full scan mode as afforded by quadrupoles in single ion monitoring (SIM) mode.

In traditional TOF design this theoretical sensitivity is not reach because of fhte manner in which ions are extracted from the ion source (orthogonal extraction).

Using innovative ion optics, BenchTOF-dx dispenses with the othogonal extraction of ions and adopts a cutting-edge and highly effective direct extraction (dx) approach. Ions are directly extracted from the ion source and transferred to the flight tube with minimal loss. The result is enhanced sensitivity over other TOF instruments using orthogonal extraction

BenchTOF-dx: Robust answer for demanding GC/MS applications

Maximum uptime and productivity is ensured by:

Mass ion stability: Unaffected by diurnal temperature variations and other factors
Linear for 4 orders of magnitude which reduces error and minimises calibration frequency
Robust mechanical design with easy component access for routine maintenance
Comprehensive yet intuitive control software
Automation of key system control parameters (e.g. detector optimisation)

BenchTOF-dx acquires 10,000 scans every second. These are packaged in "scansets" for ease of data transfer and written to hard disc.

In this example, 1000 scans are added to one"scanset" every 0.1 secs and are saved to hard disc at a "scanset" rate of 10 Hz.

Elimination of spectral skew aids library identification

The speed of BenchTOF-dx spectral acquisition (10,000 full scans every second) makes it the ideal MS platform for resolving individual components in complex total ion chromatogram (TIC) profiles.

This is partly because the scan speed of BenchTOF-dx totally eliminates spectral skew within and across a peak.

Skew occurs in slower scanning instruments (e.g. quadrupoles) because the ratio of ions eluting from the GC column changes during the finite time it takes to scan across the mass range. Speeding up the scanning rate can eliminate the spectral skew, but a lowering of sensitivity is the compromise.

BenchTOF-dx eliminates spectral skew without compromising instrument sensitivity. This improves the match quality of library search data from scans at the start or end of peaks, thereby aiding the identification of analytes of interest.

This absence of “skew” also enables BenchTOF-dx spectra to be used directly in advanced data analysis/ interpretation software such as ALMSCO TargetView

Applications:

Original TIC data (top) without DBC compensation. Original TIC data (middle) with on-line DBC compensation. Data handling options (bottom): Library search, extracted ion chromatograms (EIC) etc.

Petroleum Liquids

Forensics

Environmental

Flavors & Tobacco

Fragrances & Perfumery

Industrial Process Diagnosis

Metabolomics

Catalysis

Soils and Sediments

Chemical Warfare Agents

further information

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